paper 4.2 Accurate Measurement of Small Delay Defect Coverage of Test Patterns

Abstract
1. Introduction
2. Prior Work
2.1 Delay Test Coverage Metric
2.1.1 Shortcomings of DTC Metric
2.2 Statistical Delay Quality Level Metric
2.2.1 Shortcomings of SDQL Metric
(page 5)
3. Proposed SDD Test Coverage Metric
3.1 Quadratic SDD Test Coverage Metric
3.2 Faster-Than-At-Speed Testing
4. Experimental Results
4.1 Sensitivity to System Frequency
4.2 Sensitivity to Defect Distribution
4.3 Timing-Aware vs. Faster-Than-At-Speed
5. Conclusion