paper 4.1 Minimizing Outlier Delay Test Cost in the Presence of Systematic Variability

Abstract
I. INTRODUCTION
II. RELATED WORK
III. SVM OUTLIER ANALYSIS
A. Delay-Test Signature
B. Similarity Measures
C. One-Class Unsupervised Learning
D. Yield Parameter Selection
IV. EXPERIMENTAL SETUP
A. Setup Overview
B. Baseline Experiments
C. Cost Reduction
V. TEST COST MINIMIZATION
A. Minimizing Samples and Patterns
B. Entropy Measure
C. Single Clock Selection
D. Three Clock Selection
VI. METHODOLOGY
A. Preparation Phase
B. Application Phase
C. Implementation Practicality
VII. BENEFITS AND LIMITATIONS OF OUTLIER ANALYSIS
VIII. SUMMARY OF KEY FINDINGS
IX. CONCLUSION