paper 2.4 Boundary-Scan Adoption – An Industry Snapshot with Emphasis on the Semiconductor Industry

Abstract
1. Introduction
2. The iNEMI Boundary-Scan Survey
2.1 Survey Objectives
2.2 Survey Methodology
3. Boundary-Scan Survey Results
3.1 Respondent Statistics
3.1.1 Board/System Test Engineering Respondent Demographics
3.1.2 Semiconductor Engineering Demographics
3.2 Boundary-Scan Standards and Initiative Knowledge and Support
3.2.1 Board/System Test Engineering Support for Boundary-Scan Standards and Initiatives
3.2.2 Semiconductor Engineering Support for Boundary-Scan Standards and Initiatives
3.3 Board/System Engineering Survey Results
3.3.1 How Important is Boundary-Scan to Board/System Test Engineers?
3.3.2 How Does Boundary-Scan Affect Product Development Time and Cost?
3.3.3 Using Boundary-Scan to Test Non-Boundary-Scan Devices
3.3.4 Verifying Semiconductor JTAG Compliance
3.3.5 Issues Encountered When Implementing Boundary-Scan
3.3.6 Attributes Important to Board/System Engineers When Choosing a Semiconductor Supplier
3.4 Semiconductor Engineering Survey Results
3.4.1 Current and Planned Support for Boundary-Scan in Semiconductor Devices
3.4.2 Factors Hindering Successful Implementation of Boundary-Scan in IC Designs
3.4.3 Target Applications for Semiconductor Designs
3.4.4 Boundary-Scan Compliance in Semiconductors
3.4.5 Boundary-Scan Verification in Semiconductors
3.4.6 Availability and Use of Extended Test Functions in Semiconductors
3.4.7 BSDL Files and Confidentiality