paper 2.1 Testing Bridges to Nowhere - Combining Boundary Scan and Capacitive Sensing

Abstract
1 Introduction
2 Capacitive Opens Test Background
3 Possible solutions, and challenges
3.1 IEEE 1149.1 Boundary Scan
3.2 1149.4 Mixed-Signal Test Bus
3.3 1149.6 Boundary Scan for Advanced I/O
3.4 Make Input-Only Pins Bi-Directional
3.5 Differential pins
3.6 Detecting Pull-up Resistors
3.7 Detecting Shorts on High-Drive Outputs
4 Details of the Proposed Boundary Scan
4.1 Not all signal pins
4.2 Toggle during Run-Test/Idle
4.3 All ST pins can drive out during ST mode
4.4 Update latch holds non-toggling pin value
4.5 Logic 1 in BSR selects toggling pins
4.6 Global toggling signal
4.7 Global ST-mode signal
4.8 Output drive
4.9 Differential outputs
5 Other capabilities of the infrastructure
5.1 Detecting pull-up resistance
5.2 Detecting shorts on high-drive outputs
6 Results
6.1 Coverage increases and/or access reductions
7 Limitations
8 Discussion