Paper 1.3 Test Effectiveness Evaluation through Analysis of Readily-Available Tester Data

1. Introduction
2. Test-Metric Evaluation using Diagnostics
2.1. Failing Chip Selection
2.2. Test Metric Evaluation
2.2.1. Bridge Fault Models
2.2.2. Gate-Exhaustive Metric
2.2.3. Physically-Aware N-Detect Test
3. Experiment
3.1. Single Suspect Failing Chips
3.2. Multiple Suspect Failing Chips
4. Discussion
4.1. Comparison of the Evaluated Test Metrics
4.2. Generalizing Test Metric Evaluation
4.3. Failing Chip Selection
4.4. Utilization of All Failing Patterns
4.5. Comparing Test Metric Evaluation Methods